A Feature Selection Methodology for Steganalysis

Reference:

Yoan Miche, Benoit Roue, Patrick Bas, and Amaury Lendasse. A feature selection methodology for steganalysis. In B. Gunsel, A. K. Jain, A. M. Tekalp, and B. Sankur, editors, MRCS06, International Workshop on Multimedia Content Representation, Classification and Security, Istanbul (Turkey), volume 4105 of Lecture Notes in Computer Science, pages 49–56. Springer-Verlag, September 11-13 2006.

Suggested BibTeX entry:

@inproceedings{miche06_1,
    author = {Yoan Miche and Benoit Roue and Patrick Bas and Amaury Lendasse},
    booktitle = {{MRCS}06, International Workshop on Multimedia Content Representation, Classification and Security, Istanbul (Turkey)},
    editor = {B. Gunsel and A. K. Jain and A. M. Tekalp and B. Sankur},
    language = {eng},
    month = {September 11-13},
    pages = {49-56},
    publisher = {Springer-Verlag},
    series = {Lecture Notes in Computer Science},
    title = {A Feature Selection Methodology for Steganalysis},
    volume = {4105},
    year = {2006},
}