A Feature Selection Methodology for Steganalysis

Reference:

Yoan Miche, Patrick Bas, Amaury Lendasse, Christian Jutten, and Olli Simula. A feature selection methodology for steganalysis. Traitement du Signal, 26(1):13–30, May 2009. http://apps.isiknowledge.com/full_record.do?product=WOS&search_mode=GeneralSearch&qid=1&SID=Q2CCC8GdiNg2eaCEBEH&page=1&doc=2.

Suggested BibTeX entry:

@article{miche092_13,
    author = {Yoan Miche and Patrick Bas and Amaury Lendasse and Christian Jutten and Olli Simula},
    journal = {Traitement du Signal},
    language = {eng},
    month = {May},
    note = {http://apps.isiknowledge.com/full_record.do?product={WOS}&search_mode=GeneralSearch&qid=1&{SID}=Q2{CCC}8GdiNg2ea{CEBEH}&page=1&doc=2},
    number = {1},
    pages = {13--30},
    title = {A Feature Selection Methodology for Steganalysis},
    volume = {26},
    year = {2009},
}