Reference:
Yoan Miche, Patrick Bas, and Amaury Lendasse. Using multiple re-embeddings for quantitative steganalysis and image reliability estimation. Technical Report TKK-ICS-R34, Aalto University School of Science and Technology, Aalto, Finland, June 2010.
Suggested BibTeX entry:
@techreport{miche_tech_rep_10_30,
address = {Aalto, Finland},
author = {Yoan Miche and Patrick Bas and Amaury Lendasse},
institution = {Aalto University School of Science and Technology},
language = {eng},
month = {June},
number = {{TKK}-{ICS}-R34},
title = {Using Multiple Re-Embeddings For Quantitative Steganalysis and Image Reliability Estimation},
year = {2010},
}
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